4N35 OPTOCOUPLER DATASHEET PDF

There are two base of the internal phototransistor from which it can be controlled one is the photo detection or IR light detection and other is connected with the pin6 of the device, therefore it can be controlled by two procedures at the same time. The max collector-emitter voltage of the phototransistor is 30V and max collector-emitter current is mA. However the collector-emitter saturation voltage is from 0. Normally the saturation voltage of transistor is 0.

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Vishay Semiconductors. Optocoupler, Phototransistor Output, with Base Connection. Each optocoupler consists of gallium arsenide infrared LED. Reverse voltage. Forward current. Surge current. Power dissipation. Collector emitter breakdown voltage. Emitter base breakdown voltage. Collector current. Isolation test voltage. Isolation thickness between emitter. I FSM. P diss. V CEO. V EBO.

V ISO. V RMS. Document Number: For technical questions, contact: optocoupleranswers vishay. Vishay Semiconductors Optocoupler, Phototransistor Output,. Comparative tracking index. Isolation resistance. Storage temperature. Operating temperature. Junction temperature. Soldering temperature 2. T stg. T amb. T sld. Stresses in excess of the absolute maximum ratings can cause permanent damage to the device.

Functional operation of the device is not. Exposure to absolute. Junction capacitance. Forward voltage 2. Reverse current 2. Collector emitter breakdown. Emitter collector breakdown. BV CEO. BV ECO. Collector base breakdown. BV CBO. I CEO. Collector emitter leakage current 2. Collector emitter capacitance. Resistance, input output 2.

R IO 10 Capacitance, input output. Minimum and maximum values are testing requirements. Typical values are characteristics of the device and are the result of engineering. Typical values are for information only and are not part of the testing requirements. Download 4N35 Datasheet. Functional operation of the device is not implied at these or any other conditions in excess of those given in the operational sections of this document.

Exposure to absolute maximum ratings for extended periods of the time can adversely affect reliability. Typical values are characteristics of the device and are the result of engineering evaluation.

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